W 3504 and W 3525

The Fast Test Systems for Backplanes and Racks

The W 3504 and W 3525 Test Systems are perfectly designed to test from medium-sized to really huge backplanes and racks. They manage the testing of a huge number of connections within a really short time period—with up to 300,000 test points.

 

The integration of test points into mobile daisy-chain cartridges avoids complicated and error-prone adaption and shows a higher accuracy. It also enables a faster, automatable contacting and leads to a higher throughput.

 

Highlights

  • Fast test speed and at the same time optimized accuracy
  • Highly variable during configuration of the test system
  • Ideal customization to an existing manufacturing system

 

Fast test speed and a the same time optimized accuracy

  • Quick test times through single transistors (single point switching matrix)
  • Highly accurate through minimization of adaption cables and the number of plug connectors between test points and the unit under test (UUT)

 

Highly variable during configuration of the test system

  • Great variety of test point modules: available with 32, 128, 192 or 256 test points
  • Optional expansion units with stationary test point cards


Ideal customization to an existing manufacturing system, including automatable contacting

  • Customizable configuration of the daisy-chain cartridges with regards to the number of contacts and the mating plugs
  • Minimum number of connection cables, since one daisy-chain cable links the tester with the first cartridge and from there only one daisy-chain cable links one cartridge with another one
W 3504 Test System

Typical areas of application

  • Tests of backplanes
  • Tests and measurement of electric components
  • Tests of keyboards and interfaces 

Supported test types

  • Connection test
  • Short test
  • Component test
  • Functional test of switches and push buttons